Explore the fundamental principles of digital integrated circuits, essential for modern electronics. This guide covers IC design, VLSI technology, and semiconductor devices, providing insights into robust system development and advanced chip architectures.
Design for Test (DFT) is a critical methodology for ensuring the testability of complex digital integrated circuits and embedded core systems. By integrating specific test logic during the design phase, DFT facilitates efficient fault detection, reduces manufacturing costs, and significantly enhances the reliability and quality of these advanced semiconductor components throughout their lifecycle.